• DocumentCode
    2710195
  • Title

    Ohmic effects in BAW-resonators

  • Author

    Thalhammer, Robert ; Fattinger, Gernot ; Handtmann, Martin ; Marksteiner, Stephan

  • Author_Institution
    Infineon Technol., Neubiberg
  • fYear
    2006
  • fDate
    11-16 June 2006
  • Firstpage
    390
  • Lastpage
    393
  • Abstract
    Bulk acoustic wave (BAW) filters owe their performance advantages particularly to the excellent Q-values of the acoustic resonators. As these devices achieve very low impedances in the series resonance condition, the ohmic conductivity of the electrodes is expected to affect the device performance significantly. This paper presents a comprehensive analysis of ohmic effects including a discussion of the associated power dissipation as well as the interaction of ohmic and acoustic effects. The analysis is based on two combined techniques: first, the potential and current distribution on the electrodes and the resulting ohmic power dissipation are derived from surface vibration measured by laser interferometry and an inverse calculation of local charge distribution. The second technique is finite element modeling that has been extended by including ohmic conductivity, thus enabling a consistent electro-acoustic analysis
  • Keywords
    acoustic wave effects; bulk acoustic wave devices; finite element analysis; light interferometry; surface acoustic wave resonators; surface dynamics; BAW-resonators; acoustic effects; electro-acoustic analysis; finite element modeling; laser interferometry; local charge distribution; ohmic conductivity; ohmic effects; ohmic power dissipation; surface vibration; Acoustic devices; Acoustic waves; Conductivity; Current distribution; Electrodes; Impedance; Power dissipation; Resonance; Resonator filters; Vibration measurement; Acoustic filters; Bulk acoustic wave devices; Ohmic effects; electrode conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2006. IEEE MTT-S International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-9541-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2006.249552
  • Filename
    4014912