DocumentCode :
2710303
Title :
Mechanical properties of boron-carbon-nitrogen coatings obtained by ion beam assisted evaporation
Author :
Gago, R. ; Jiménez, I. ; Albella, J.M.
Author_Institution :
Inst. de Ciencia de Mater., CSIC, Madrid, Spain
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
189
Abstract :
Boron-carbon-nitride films, including amorphous carbon (a-C), carbon nitride (CNx) and ternary compounds (BCxN y), were deposited on silicon substrates by ion beam assisted deposition (IBAD) techniques. The films were deposited by evaporating either graphite or boron carbide (B4C) targets, with simultaneous ion bombardment from a precursor N2+CH4 +Ar gas mixture. IBAD has permitted to cover a wide range of compositions as a function of deposition parameters. The composition and bonding structure of the films have been carefully studied, including analysis with powerful characterisation techniques such as time of flight elastic recoil detection analysis (TOF-ERDA) and X-ray absorption near-edge spectroscopy (XANES). Depending on the growth conditions, the ternary films can form true ternary compounds of segregated grains of three different phases: tetrahedral BN and C, hexagonal BN and C, and icosahedral B12-structures. Mechanical characterisation of the films has been also performed, including measurements of hardness, elastic modulus, and friction coefficients. The optimal values encountered are hardness of ~35 GPa, and friction coefficients of ~0.05. The deposition parameters have been related to the composition bonding structure, and mechanical properties of the coatings
Keywords :
XANES; boron compounds; carbon; carbon compounds; elastic moduli; friction; hardness; ion beam assisted deposition; ion-surface impact; time of flight spectra; vacuum deposited coatings; B; B4C evaporation; BC; BCxNy; BCN; BCN coatings; C; CN; CNx; Si substrates; X-ray absorption near-edge spectroscopy; amorphous C; bonding structure; composition; elastic modulus; films; friction coefficients; graphite evaporation; hardness; hexagonal BN; hexagonal C; icosahedral B12-structures; ion beam assisted deposition; ion beam assisted evaporation; mechanical properties; precursor N2/methane/Ar gas mixture; segregated grains; simultaneous ion bombardment; tetrahedral BN; tetrahedral C; time of flight elastic recoil detection analysis; Amorphous materials; Bonding; Boron; Carbon compounds; Coatings; Friction; Ion beams; Mechanical factors; Semiconductor films; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2000. CAS 2000 Proceedings. International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-5885-6
Type :
conf
DOI :
10.1109/SMICND.2000.890215
Filename :
890215
Link To Document :
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