DocumentCode
2710376
Title
Exploration of the origin of random error in spectrum intensity measured with THz-TDS
Author
Takeda, M. ; Tripathi, S.R. ; Aoki, M. ; Hiromoto, N.
Author_Institution
Grad. Sch. of Sci. & Technol., Shizuoka Univ., Hamamatsu, Japan
fYear
2010
fDate
5-10 Sept. 2010
Firstpage
1
Lastpage
2
Abstract
We explored an origin of the random error in intensity spectra measured with THz-TDS. The optical-delay scanning, variations in temperature and humidity, the intensity fluctuation of fs-laser, and the THz detectors of LT-GaAs PC antenna and ZnTe EO-crystal are not the predominant origin of the random error.
Keywords
antennas; electro-optical devices; gallium arsenide; high-speed optical techniques; measurement errors; terahertz spectroscopy; terahertz wave detectors; zinc compounds; GaAs; ZnTe; electro-optic crystal; femtosecond laser; humidity variation; intensity fluctuation; intensity spectra; optical delay scanning; photoconductive antenna; random error; spectrum intensity; temperature variation; terahertz detector; terahertz time domain spectroscopy; Adaptive optics; Antenna measurements; Antennas; Fluctuations; Measurement by laser beam; Signal to noise ratio; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location
Rome
Print_ISBN
978-1-4244-6655-9
Type
conf
DOI
10.1109/ICIMW.2010.5612455
Filename
5612455
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