• DocumentCode
    2710506
  • Title

    A Practical Comparison of Mask Making Pattern Generation Systems

  • Author

    Hensley, Kevin

  • Author_Institution
    Coll. of Eng., Univ. of Utah, Salt Lake City, UT, USA
  • fYear
    2012
  • fDate
    9-10 July 2012
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    A Practical Comparison of Mask Making Pattern Generation Systems Kevin Hensley Utah Nanofab, College of Engineering, University of Utah Category: Equipment acquisition, capability development Three mask making systems utilizing different pattern generation technologies were evaluated. The systems include laser direct write (Heidelberg MicroPG), variable aperture UV mercury arc lamp exposure (Electromask CC250), and UV lamp DLP projection (IMP Xpress). A test pattern was exposed on each system and measurements and images were acquired and compared. Results show that the laser direct-write system is preferred for both curved shapes and high-resolution features. Additionally, maintenance and facility costs where evaluated for all systems.
  • Keywords
    arc lamps; masks; ultraviolet sources; College of Engineering; Electromask CC250; Heidelberg MicroPG; IMP Xpress; Kevin Hensley Utah Nanofab; UV lamp DLP projection; University of Utah; capability development; equipment acquisition; laser direct write; mask making; pattern generation systems; variable aperture UV mercury arc lamp exposure; Apertures; Educational institutions; Lighting; Maintenance engineering; Measurement by laser beam; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry, Micro/Nano Symposium (UGIM), 2012 19th Biennial
  • Conference_Location
    Berkeley, CA
  • ISSN
    0749-6877
  • Print_ISBN
    978-1-4577-1751-2
  • Electronic_ISBN
    0749-6877
  • Type

    conf

  • DOI
    10.1109/UGIM.2012.6247106
  • Filename
    6247106