DocumentCode :
2710506
Title :
A Practical Comparison of Mask Making Pattern Generation Systems
Author :
Hensley, Kevin
Author_Institution :
Coll. of Eng., Univ. of Utah, Salt Lake City, UT, USA
fYear :
2012
fDate :
9-10 July 2012
Firstpage :
1
Lastpage :
1
Abstract :
A Practical Comparison of Mask Making Pattern Generation Systems Kevin Hensley Utah Nanofab, College of Engineering, University of Utah Category: Equipment acquisition, capability development Three mask making systems utilizing different pattern generation technologies were evaluated. The systems include laser direct write (Heidelberg MicroPG), variable aperture UV mercury arc lamp exposure (Electromask CC250), and UV lamp DLP projection (IMP Xpress). A test pattern was exposed on each system and measurements and images were acquired and compared. Results show that the laser direct-write system is preferred for both curved shapes and high-resolution features. Additionally, maintenance and facility costs where evaluated for all systems.
Keywords :
arc lamps; masks; ultraviolet sources; College of Engineering; Electromask CC250; Heidelberg MicroPG; IMP Xpress; Kevin Hensley Utah Nanofab; UV lamp DLP projection; University of Utah; capability development; equipment acquisition; laser direct write; mask making; pattern generation systems; variable aperture UV mercury arc lamp exposure; Apertures; Educational institutions; Lighting; Maintenance engineering; Measurement by laser beam; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
University/Government/Industry, Micro/Nano Symposium (UGIM), 2012 19th Biennial
Conference_Location :
Berkeley, CA
ISSN :
0749-6877
Print_ISBN :
978-1-4577-1751-2
Electronic_ISBN :
0749-6877
Type :
conf
DOI :
10.1109/UGIM.2012.6247106
Filename :
6247106
Link To Document :
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