A Novel Approach for Effective Import of Nonlinear Device Characteristics into CAD for Large Signal Power Amplifier Design

This paper introduces a new approach allowing for the direct utilization of large signal measurement data in the PA CAD design process. A model, which we term as "truth lookup model", has been developed to import non-linear measurement data into a non-linear CAD simulator. Its implementation in Agilent ADS simulator has been verified on several different types of high frequency transistors. Through correct formulation of the "truth look-up model" data sets it has been found that this approach can accurately predict the nonlinear behavior of devices under CW excitations, even when interpolation or extrapolation of measured data is required. Furthermore, the model also demonstrates its potential for predicting the behavior of devices under multi-tone signal excitations