DocumentCode
2710695
Title
A New Approach for Test Pattern Generation for Digital Cores in Mixed Signal Circuits
Author
Kundu, Rupam ; Chaubey, V.K.
Author_Institution
Samsung India Operations, Bangalore
fYear
2007
fDate
18-21 Dec. 2007
Firstpage
3
Lastpage
8
Abstract
This paper proposes a new algorithm in an optical network using online routing with the application of optical buffers comprising of delay-lines (FDLs). The model for the algorithm has been theoretically developed and the corresponding call connection probability has been calculated. The limitation on the amount of delay permitted per packet has been addressed by limiting the number of delay-lines used in switch fabric of the network. The algorithm proposed is deterministic. It employs the concept of online routing to implement ´look ahead´ characteristics and thus aims to design an intelligent optical network.
Keywords
carrier sense multiple access; optical delay lines; optical fibre networks; telecommunication network routing; CSMA-CA optical network; fiber delay-lines; online routing; optical buffers; Circuits; Fabrics; Optical buffering; Optical design; Optical fiber networks; Optical packet switching; Optical switches; Probability; Routing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Computing and Communications, 2007. ADCOM 2007. International Conference on
Conference_Location
Guwahati, Assam
Print_ISBN
0-7695-3059-1
Type
conf
DOI
10.1109/ADCOM.2007.119
Filename
4425943
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