DocumentCode :
2710757
Title :
Object arrangement estimation using color edge profile
Author :
Nakamura, Yuichi ; Sumida, Kaoaki ; Ohta, Yuichi
Author_Institution :
Inst. of Inf. Sci. & Electron., Tsukuba Univ., Japan
Volume :
1
fYear :
1998
fDate :
16-20 Aug 1998
Firstpage :
754
Abstract :
We propose a method for classifying image edges caused by different physical phenomena, i.e. reflectance change, shadow, occlusion, etc., by using color information around the edge. We assumed several simple models for object spatial arrangements. For each of them, typical locus of RGB values along the normal direction of each edge segment is modeled. Each locus is parametrized by several features. In the classification of actual edges, the most plausible phenomenon is selected by checking the consistency between the parameters from an actual edge profile and those from each model. For the improvement of accuracy, Dempster-Shafer probability model is employed to deal with the above parameters that are often weak and uncertain. Experiments showed good performances
Keywords :
edge detection; feature extraction; image colour analysis; probability; Dempster-Shafer probability model; RGB space; color edge profile; edge detection; edge profile; feature extraction; locus model; object arrangement estimation; reflectance change; Cause effect analysis; Extraterrestrial phenomena; Image analysis; Image color analysis; Image segmentation; Light sources; Lighting; Performance analysis; Reflectivity; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
Conference_Location :
Brisbane, Qld.
ISSN :
1051-4651
Print_ISBN :
0-8186-8512-3
Type :
conf
DOI :
10.1109/ICPR.1998.711256
Filename :
711256
Link To Document :
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