• DocumentCode
    2711141
  • Title

    Impact of electrode surface modulation on time-dependent dielectric breakdown

  • Author

    Kong Boon Yeap ; Tian Shen ; Zhang, Galor Wenyi ; Sing Fui Yap ; Holt, Brian ; Gondal, Arfa ; Seungman Choi ; San Leong Liew ; Yao, Walter ; Justison, Patrick

  • Author_Institution
    GLOBALFOUNDRIES, Malta, NY, USA
  • fYear
    2015
  • fDate
    19-23 April 2015
  • Abstract
    This study demonstrates the impact of electrode surface modulation on conduction mechanism and TDDB behavior. We found that the Schottky barrier height can be decreased by an unexpected change of the electrode surface materials, due to introduction of new barrier/seed materials. As TDDB is an electron-fluence driven mechanism, the changes of barrier height have a potential impact not only on the lifetime, but also on the voltage acceleration. For an accurate evaluation of samples with the same condition, a large sample size was employed in local reticle.
  • Keywords
    Schottky barriers; electric breakdown; electrodes; Schottky barrier; TDDB; conduction mechanism; electrode surface material; electrode surface modulation impact; electron-fluence driven mechanism; time dependent dielectric breakdown; voltage acceleration; Acceleration; Dielectric breakdown; Dielectric constant; Electrodes; Fitting; Metals; Schottky emission; cobalt; interconnect reliability; time-dependent dielectric breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2015 IEEE International
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/IRPS.2015.7112668
  • Filename
    7112668