DocumentCode :
2711295
Title :
Compact Electrothermal Modeling of an X-band MMIC
Author :
Luniya, Sonali ; Batty, William ; Caccamesi, Vincent ; Garcia, Mikael ; Christoffersen, Carlos ; Melamed, Samson ; Davis, W. Rhett ; Steer, Michael
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC
fYear :
2006
fDate :
11-16 June 2006
Firstpage :
651
Lastpage :
654
Abstract :
Compact electrothermal modeling of lumped electrical devices and compact thermal modeling of volumetric materials enables efficient electrothermal modeling of microwave circuits. The compact thermal model of the body of an X-band MMIC is based on analytical solutions of the heat diffusion equation in thermal sub-volumes. The model is accurate and captures thermal nonlinearities. The model considers complex MMIC features such as surface metallization and vias, as well as the mounting configurations including lead-frame, carrier, and printed circuit board. This is coupled with electrothermal models of transistors and of resistors. The models are incorporated in a multi-physics simulator that uses the same model in both transient and harmonic analysis of an X-band LNA MMIC. Simulations are validated with steady-state thermal measurements
Keywords :
MMIC amplifiers; circuit simulation; harmonic analysis; integrated circuit modelling; low noise amplifiers; thermal analysis; LNA MMIC; X band; circuit simulation; compact electrothermal modeling; harmonic analysis; heat diffusion equation; lumped electrical devices; microwave circuits; resistors electrothermal models; steady-state thermal measurements; thermal nonlinearities; transient analysis; transistors electrothermal models; volumetric materials; Circuit simulation; Coupling circuits; Electromagnetic heating; Electrothermal effects; MMICs; Metallization; Microwave circuits; Microwave devices; Nonlinear equations; Printed circuits; MMIC; circuit sim-ulation; electrothermal effects; modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
ISSN :
0149-645X
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2006.249698
Filename :
4014986
Link To Document :
بازگشت