DocumentCode
2711295
Title
Compact Electrothermal Modeling of an X-band MMIC
Author
Luniya, Sonali ; Batty, William ; Caccamesi, Vincent ; Garcia, Mikael ; Christoffersen, Carlos ; Melamed, Samson ; Davis, W. Rhett ; Steer, Michael
Author_Institution
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC
fYear
2006
fDate
11-16 June 2006
Firstpage
651
Lastpage
654
Abstract
Compact electrothermal modeling of lumped electrical devices and compact thermal modeling of volumetric materials enables efficient electrothermal modeling of microwave circuits. The compact thermal model of the body of an X-band MMIC is based on analytical solutions of the heat diffusion equation in thermal sub-volumes. The model is accurate and captures thermal nonlinearities. The model considers complex MMIC features such as surface metallization and vias, as well as the mounting configurations including lead-frame, carrier, and printed circuit board. This is coupled with electrothermal models of transistors and of resistors. The models are incorporated in a multi-physics simulator that uses the same model in both transient and harmonic analysis of an X-band LNA MMIC. Simulations are validated with steady-state thermal measurements
Keywords
MMIC amplifiers; circuit simulation; harmonic analysis; integrated circuit modelling; low noise amplifiers; thermal analysis; LNA MMIC; X band; circuit simulation; compact electrothermal modeling; harmonic analysis; heat diffusion equation; lumped electrical devices; microwave circuits; resistors electrothermal models; steady-state thermal measurements; thermal nonlinearities; transient analysis; transistors electrothermal models; volumetric materials; Circuit simulation; Coupling circuits; Electromagnetic heating; Electrothermal effects; MMICs; Metallization; Microwave circuits; Microwave devices; Nonlinear equations; Printed circuits; MMIC; circuit sim-ulation; electrothermal effects; modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location
San Francisco, CA
ISSN
0149-645X
Print_ISBN
0-7803-9541-7
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2006.249698
Filename
4014986
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