DocumentCode
2711469
Title
Photoreflectance spectroscopy with a Fourier-transform infrared spectrometer: From visible to far infrared
Author
Shao, Jun ; Lu, Wei
Author_Institution
Nat. Lab. for Infrared Phys., Chinese Acad. of Sci., Shanghai, China
fYear
2010
fDate
5-10 Sept. 2010
Firstpage
1
Lastpage
3
Abstract
Recent progress in photoreflectance spectroscopy at the Shanghai Institute of Technical Physics was reviewed, with the focus on the extension of functional spectral range for the first time from 5 μm to FIR of 20 μm and the application to narrow-gap semiconductors and nanostructure materials.
Keywords
Fourier transform spectroscopy; infrared spectroscopy; nanostructured materials; photoreflectance; semiconductors; visible spectroscopy; Fourier transform infrared spectrometer; far infrared spectra; nanostructure material; narrow gap semiconductor; photoreflectance spectroscopy; visible spectra; wavelength 5 mum to 20 mum; Detectors; Gallium arsenide; Helium; Physics; Semiconductor device measurement; Signal to noise ratio; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location
Rome
Print_ISBN
978-1-4244-6655-9
Type
conf
DOI
10.1109/ICIMW.2010.5612523
Filename
5612523
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