Title :
Photoreflectance spectroscopy with a Fourier-transform infrared spectrometer: From visible to far infrared
Author :
Shao, Jun ; Lu, Wei
Author_Institution :
Nat. Lab. for Infrared Phys., Chinese Acad. of Sci., Shanghai, China
Abstract :
Recent progress in photoreflectance spectroscopy at the Shanghai Institute of Technical Physics was reviewed, with the focus on the extension of functional spectral range for the first time from 5 μm to FIR of 20 μm and the application to narrow-gap semiconductors and nanostructure materials.
Keywords :
Fourier transform spectroscopy; infrared spectroscopy; nanostructured materials; photoreflectance; semiconductors; visible spectroscopy; Fourier transform infrared spectrometer; far infrared spectra; nanostructure material; narrow gap semiconductor; photoreflectance spectroscopy; visible spectra; wavelength 5 mum to 20 mum; Detectors; Gallium arsenide; Helium; Physics; Semiconductor device measurement; Signal to noise ratio; Temperature measurement;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5612523
