DocumentCode
271147
Title
Characterization of Nuclear Materials in Extreme Conditions: Raman Spectroscopy Approach
Author
GuimbretieÌ€re, G. ; Desgranges, L. ; Jegou, C. ; CanizareÌ€s, A. ; Simon, P. ; Caraballo, R. ; Raimboux, N. ; Barthe, M.-F. ; Ammar, M.-R. ; Maslova, O.A. ; Duval, Fabrice ; OmneÌe, R.
Author_Institution
CEMHTI, Orléans, France
Volume
61
Issue
4
fYear
2014
fDate
Aug. 2014
Firstpage
2045
Lastpage
2051
Abstract
A review is given of our last advances on Raman spectroscopy characterization of irradiated and/or leached UO2, PuO2 and (U,Pu)O2 samples. For this purpose, three original Raman setups dedicated to the study of nuclear materials were involved. In every case, irradiation-induced Raman defect bands in the 500 - 750 cm-1 range was observed. For UO2, an annealing temperature experiment suggests that these defect bands could be the signatures of medium-range structured defects. Besides, the leaching experiments show different behavior between the irradiated in situ probed UO2 ceramic and post mortem probed [UO2 + (U,Pu)O2] sample: The growth of an altered layer made of studtite and schoepite phases was monitored at the surface of UO2 ceramic, while post-mortem studies reveal the presence of U3O8 and studtite phases at the surface of the UO2 grains of the binary sample. No alteration layer was observed at the surface of the leached (U,Pu)O2 grains.
Keywords
Raman spectroscopy; fission reactor fuel; fission reactor instrumentation; fission reactor safety; plutonium compounds; radiation effects; uranium compounds; PuO2; Raman spectroscopy characterization; U3O8; UO2; UO2 ceramic; annealing; annealing temperature experiment; irradiation-induced Raman defect bands; leaching; medium-range structured defect; nuclear material study; schoepite phase; studtite phase; Annealing; Ceramics; Fuels; Leaching; Radiation effects; Raman scattering; ${rm PuO}_{2}$ ; ${rm UO}_{2}$ ; damage; in situ; irradiation; kinetic; leaching; mapping; radiolysis; raman;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2014.2311166
Filename
6820785
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