DocumentCode :
271152
Title :
Efficient Mitigation of Data and Control Flow Errors in Microprocessors
Author :
Parra, Lucas ; Lindoso, A. ; Portela, Marta ; Entrena, L. ; Restrepo-Calle, Felipe ; Cuenca-Asensi, Sergio ; Martínez-Alvarez, Antonio
Author_Institution :
Electron. Technol. Dept., Univ. Carlos III of Madrid, Leganes, Spain
Volume :
61
Issue :
4
fYear :
2014
fDate :
Aug. 2014
Firstpage :
1590
Lastpage :
1596
Abstract :
The use of microprocessor-based systems is gaining importance in application domains where safety is a must. For this reason, there is a growing concern about the mitigation of SEU and SET effects. This paper presents a new hybrid technique aimed to protect both the data and the control-flow of embedded applications running on microprocessors. On one hand, the approach is based on software redundancy techniques for correcting errors produced in the data. On the other hand, control-flow errors can be detected by reusing the on-chip debug interface, existing in most modern microprocessors. Experimental results show an important increase in the system reliability even superior to two orders of magnitude, in terms of mitigation of both SEUs and SETs. Furthermore, the overheads incurred by our technique can be perfectly assumable in low-cost systems.
Keywords :
computer debugging; microcomputers; radiation hardening (electronics); redundancy; software fault tolerance; SET; SEU; control flow errors; data mitigation; fault tolerance; hybrid technique; microprocessor-based systems; on-chip debug interface; single event transients; single event upset; software redundancy; system reliability; Clocks; Hardware; Microprocessors; Monitoring; Radiation detectors; Registers; Software; Fault tolerance; microprocessor; single event transient (SETs); single event upset (SEUs); soft error;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2014.2310492
Filename :
6820795
Link To Document :
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