• DocumentCode
    2711634
  • Title

    AlGaN/GaN HFETs on Si Substrates for WiMAX Applications

  • Author

    Therrien, R. ; Singhal, S. ; Chaudhari, A. ; Nagy, W. ; Marquart, J. ; Johnson, J.W. ; Hanson, A.W. ; Riddle, J. ; Rajagopal, P. ; Preskenis, B. ; Zhitova, O. ; Willamson, J. ; Kizilyalli, I.C. ; Linthicum, K.J.

  • Author_Institution
    Nitronex Corp., Raleigh, NC
  • fYear
    2006
  • fDate
    11-16 June 2006
  • Firstpage
    710
  • Lastpage
    713
  • Abstract
    AlGaN/GaN HFETs on Si substrates are tested under OFDM modulations and show excellent performance from 3.3GHz to 3.8GHz. Performance on an 8mm device (NPT35010) in power small outline package (PSOP2) shows 1.5W output power, 11.2dB gain, 28.6% drain efficiency and 2% EVM at 3.5GHz. Large periphery 36mm devices were mounted in ceramic packages (NPT35050) and showed greater than 7W output power, > 11dB gain, 27.2% drain efficiency and 2% EVM at 3.5 GHz. Additionally data was taken across process from 23 devices and 5 process lots to demonstrate repeatability. Finally the same RF data was collected over flange temperature from -40degC to +85degC and demonstrated stable performance over temperature. These results demonstrate the potential for GaN-on-Si HEMTs for use in WiMAX applications
  • Keywords
    III-V semiconductors; OFDM modulation; WiMax; aluminium compounds; gallium compounds; microwave field effect transistors; microwave power transistors; power HEMT; wide band gap semiconductors; -40 to 85 C; 11 dB; 11.2 dB; 3.5 GHz; 36 mm; 8 mm; AlGaN-GaN; HFET; NPT35010; NPT35050; OFDM modulations; PSOP2; RF power transistors; WiMAX applications; ceramic package; high electron mobility transistors; power small outline package; Aluminum gallium nitride; Gallium nitride; HEMTs; MODFETs; OFDM modulation; Packaging; Power generation; Temperature; Testing; WiMAX; AlGaN/GaN HFETs; GaN high electron mobility transistors (HEMTs); RF power transistors; linearity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2006. IEEE MTT-S International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-9541-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2006.249732
  • Filename
    4015003