DocumentCode
2711720
Title
Analyzing partial discharge pulse sequences-a new approach to investigate degradation phenomena
Author
Hoof, M. ; Patsch, R.
Author_Institution
Inst. of Mater. of Electr. Eng., Siegen Univ., Germany
fYear
1994
fDate
5-8 Jun 1994
Firstpage
327
Lastpage
331
Abstract
This paper presents a new method of partial discharge data analysis for the investigation of space charge and degradation phenomena in high voltage insulation systems. The basic principles of the pulse-sequence-analysis are illustrated and the characteristic differences with regard to standard procedures that have been established during the past few years are outlined. A description is given of an electronic partial discharge acquisition system, which is designed on a plug-in interface board for a standard personal computer to perform long term measurements of all the discharge parameters required for the succeeding PSA. Electrical treeing in polyethylene is used to demonstrate the usefulness of the PSA method. It is shown that information on space charge phenomena and the development of the local degradation can be obtained by considering correlations between consecutive discharge pulses
Keywords
add-on boards; automatic test equipment; high-voltage techniques; insulation testing; microcomputer applications; partial discharges; polyethylene insulation; power engineering computing; space charge; trees (electrical); HV insulation; PD pulse sequence analysis; degradation phenomena; discharge parameters; electrical treeing; electronic PD acquisition system; high voltage insulation systems; long term measurements; partial discharge data analysis; partial discharge pulse sequences; personal computer; plug-in interface board; polyethylene; space charge; Data analysis; Degradation; Insulation; Measurement standards; Microcomputers; Partial discharge measurement; Partial discharges; Performance evaluation; Space charge; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 1994., Conference Record of the 1994 IEEE International Symposium on
Conference_Location
Pittsburgh, PA
ISSN
1089-084X
Print_ISBN
0-7803-1942-7
Type
conf
DOI
10.1109/ELINSL.1994.401501
Filename
401501
Link To Document