• DocumentCode
    2711754
  • Title

    Hardware Controlled and Software Independent Fault Tolerant FPGA Architecture

  • Author

    Goel, Neeraj ; Paul, Kolin

  • Author_Institution
    IT Delhi, Delhi
  • fYear
    2007
  • fDate
    18-21 Dec. 2007
  • Firstpage
    497
  • Lastpage
    502
  • Abstract
    With the increase in complexity of fabrication techniques, yield of the chip production decreases at deep sub-micron technologies. In future fault tolerant techniques will be important to increase the yield of the VLSI chips in advanced fabrication technologies. In regular structure like FPGA, redundancy is commonly used for fault tolerance. Most of the techniques found so far in literature talk about software based changes in the configuration data. In this work we present a solution in which configuration bit stream of FPGA is modified by a hardware controller that is present on the chip itself. The technique uses redundant columns for replacing faulty cells. Experiments on different circuits using VPR tool shows that there is an average 2.6% increase in the critical path delay while no increase in the area per cell due to our approach.
  • Keywords
    VLSI; fault tolerance; field programmable gate arrays; logic design; FPGA architecture; VLSI chip; VPR tool; critical path delay; fault tolerance; hardware controller; Circuit faults; Computer architecture; Delay; Fabrication; Fault tolerance; Field programmable gate arrays; Hardware; Production; Redundancy; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Computing and Communications, 2007. ADCOM 2007. International Conference on
  • Conference_Location
    Guwahati, Assam
  • Print_ISBN
    0-7695-3059-1
  • Type

    conf

  • DOI
    10.1109/ADCOM.2007.17
  • Filename
    4426018