• DocumentCode
    2711887
  • Title

    3D-FEM analysis of electromagnetic emission from PCB

  • Author

    Tanabe, Shinji ; Gofuku, Eishi ; Itoh, Takayuki ; Murata, Yuichiro ; Ozeki, Tatsuo

  • Author_Institution
    Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Hyogo, Japan
  • fYear
    1996
  • fDate
    19-23 Aug 1996
  • Firstpage
    343
  • Lastpage
    346
  • Abstract
    The emission of electromagnetic (EM) noise from printed circuit boards (PCBs) is analyzed using a three dimensional finite element method (3D-FEM). The emission of EM noise depends on the transmission line structure and ground structure including the connection between the system ground (SG) and frame ground (FG). We applied the 3D-FEM analysis to the design of a thin film transistor liquid crystal display´s (TFT-LCD) PCB. The calculation results were confirmed by experiments using model transmission lines. The 360 MHz noise emission from a strip line structure is about 1/10 of that from a microstrip line structure for a particular specification. Plural FGs generate loop currents and increase the noise emission. The distance between the noise source and FG is an important factor in deciding the noise emission
  • Keywords
    finite element analysis; liquid crystal displays; microstrip lines; noise; printed circuit design; radiofrequency interference; strip lines; thin film transistors; 360 MHz; 3D-FEM; EM noise; electromagnetic emission; electromagnetic noise; frame ground; ground structure; loop currents; microstrip line structure; model transmission lines; noise emission; printed circuit boards; strip line structure; system ground; thin film transistor liquid crystal display PCB; three dimensional finite element method; transmission line structure; Circuit noise; Distributed parameter circuits; Electromagnetic analysis; Electromagnetic interference; Finite element methods; Liquid crystal displays; Printed circuits; Strips; Thin film transistors; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-3207-5
  • Type

    conf

  • DOI
    10.1109/ISEMC.1996.561255
  • Filename
    561255