DocumentCode
2711887
Title
3D-FEM analysis of electromagnetic emission from PCB
Author
Tanabe, Shinji ; Gofuku, Eishi ; Itoh, Takayuki ; Murata, Yuichiro ; Ozeki, Tatsuo
Author_Institution
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Hyogo, Japan
fYear
1996
fDate
19-23 Aug 1996
Firstpage
343
Lastpage
346
Abstract
The emission of electromagnetic (EM) noise from printed circuit boards (PCBs) is analyzed using a three dimensional finite element method (3D-FEM). The emission of EM noise depends on the transmission line structure and ground structure including the connection between the system ground (SG) and frame ground (FG). We applied the 3D-FEM analysis to the design of a thin film transistor liquid crystal display´s (TFT-LCD) PCB. The calculation results were confirmed by experiments using model transmission lines. The 360 MHz noise emission from a strip line structure is about 1/10 of that from a microstrip line structure for a particular specification. Plural FGs generate loop currents and increase the noise emission. The distance between the noise source and FG is an important factor in deciding the noise emission
Keywords
finite element analysis; liquid crystal displays; microstrip lines; noise; printed circuit design; radiofrequency interference; strip lines; thin film transistors; 360 MHz; 3D-FEM; EM noise; electromagnetic emission; electromagnetic noise; frame ground; ground structure; loop currents; microstrip line structure; model transmission lines; noise emission; printed circuit boards; strip line structure; system ground; thin film transistor liquid crystal display PCB; three dimensional finite element method; transmission line structure; Circuit noise; Distributed parameter circuits; Electromagnetic analysis; Electromagnetic interference; Finite element methods; Liquid crystal displays; Printed circuits; Strips; Thin film transistors; Transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location
Santa Clara, CA
Print_ISBN
0-7803-3207-5
Type
conf
DOI
10.1109/ISEMC.1996.561255
Filename
561255
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