DocumentCode :
2711989
Title :
Electrical characterisation and reliability studies of thick film gas sensor structures
Author :
Czech, I. ; Manea, J. ; Roggen, J. ; Huyberechts, G. ; Stals, L. ; de Schepper, L.
Author_Institution :
Mater. Phys. Div., Limburgs Univ. Centrum, Diepenbeek, Belgium
fYear :
1996
fDate :
25-28 Mar 1996
Firstpage :
99
Lastpage :
103
Abstract :
The three major problems of gas sensing devices are the sensitivity to gases, the selectivity towards different gases and the electrical stability of the device. This paper describes the study of the electrical stability of a thick film SnO2 gas sensor which has been investigated with an in-situ conductance measurement technique, in order to understand the disturbing problems of the resistance drift of the sensor material during the operation of the gas sensor. For this purpose a new test structure has been realised in screen printing technology, such that each layer in the gas sensor can be characterised and the influence of the top layer on underlying layers can be investigated. By using in-situ conductance measurements the relevant electrical properties are measured continuously during a predefined temperature profile. The in-situ technique offers both a high measurement accuracy, as well as the availability of many data points when compared to conventional off-line testing methods. As a result, a complete electrical characterisation of the gas sensor could be done very accurately
Keywords :
electrical conductivity measurement; gas sensors; semiconductor device reliability; thick film devices; tin compounds; SnO2; electrical stability; in-situ conductance measurement; reliability; resistance drift; screen printing; thick film gas sensor; Electric resistance; Electric variables measurement; Gas detectors; Gases; Measurement techniques; Sensor phenomena and characterization; Stability; Testing; Thick film sensors; Thick films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1996. ICMTS 1996. Proceedings. 1996 IEEE International Conference on
Conference_Location :
Trento
Print_ISBN :
0-7803-2783-7
Type :
conf
DOI :
10.1109/ICMTS.1996.535628
Filename :
535628
Link To Document :
بازگشت