• DocumentCode
    2712065
  • Title

    Boolean behavior extraction from circuit layout

  • Author

    Liao, Jiann ; Ni, Lionel M.

  • Author_Institution
    Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
  • fYear
    1989
  • fDate
    17-19 May 1989
  • Firstpage
    139
  • Lastpage
    143
  • Abstract
    A Boolean behavior extraction method for static MOS circuits is proposed. From the signal-flow point of view, this approach can unify the functionality extraction for different design styles, including pass transistor logic, which cannot be treated using the traditional gate-level circuit model. To handle high-impedance states in MOS transistors, three Boolean equations, which are an extension of two-valued Boolean equations, are needed to describe the behavior of each node. Rules are presented to extract the Boolean behavior as well as to check the electrical safeness at some special nodes. An algorithm is used to identify these special nodes and guide the rules to perform functionality extraction. The extraction process is fast, since rules only apply to a small portion of the transistor group each time and few signal paths need to be found. Furthermore, it is easy to locate design error, both electrical and functional, because the error is confined to a small region by the algorithm during the extraction phase
  • Keywords
    Boolean functions; MOS integrated circuits; circuit layout CAD; Boolean behavior extraction method; Boolean equations; circuit layout; electrical safeness; extraction phase; functionality extraction; gate-level circuit model; high-impedance states; pass transistor logic; signal paths; signal-flow; static MOS circuits; Boolean functions; Computer science; Formal verification; Impedance; Logic circuits; Logic design; MOSFETs; Switches; Tiles; Variable structure systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems and Applications, 1989. Proceedings of Technical Papers. 1989 International Symposium on
  • Conference_Location
    Taipei
  • Type

    conf

  • DOI
    10.1109/VTSA.1989.68600
  • Filename
    68600