• DocumentCode
    2712143
  • Title

    A study of aspect oriented testing techniques

  • Author

    Kumar, Mohit ; Sharma, Akashdeep ; Garg, Sushil

  • Author_Institution
    CSE Dept., RIMT-IET, Gobindgarh, India
  • Volume
    2
  • fYear
    2009
  • fDate
    4-6 Oct. 2009
  • Firstpage
    996
  • Lastpage
    1001
  • Abstract
    Aspect oriented programming is a new paradigm it builds on the bases on object oriented approach. It aims at reduction of code and to provide higher cohesion. Testing aspect oriented programs may be more difficult than traditional ones, due to the large impact that aspects have on the static structure and dynamic behavior of the overall system. Aspects may be sources for failures due to new kinds of faults in their code, by affecting the overall quality of the system. New testing approaches and criteria, taking into account the aspect-oriented constructs, are needed to capture the new kind of program failures. In this paper we analyze the testing strategies of AOP. Four testing strategies have been examined and their effectiveness is measured in terms of their ability to find different kind of faults as described in a fault model. Based on this analysis, conclusions have been drawn about the current state of the research in the testing of aspect oriented programs and future directions have been explored.
  • Keywords
    aspect-oriented programming; program testing; software fault tolerance; software quality; aspect oriented programming; aspect oriented testing techniques; aspect-oriented constructs; code reduction; dynamic behavior; object oriented approach; program failures; static structure; system quality; Concurrent computing; Electronic equipment testing; Erbium; Formal specifications; Industrial electronics; Life testing; Object oriented modeling; Object oriented programming; Software testing; System testing; Aspect-oriented software testing; Software test technique effectiveness; Testing challenges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics & Applications, 2009. ISIEA 2009. IEEE Symposium on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-4681-0
  • Electronic_ISBN
    978-1-4244-4683-4
  • Type

    conf

  • DOI
    10.1109/ISIEA.2009.5356308
  • Filename
    5356308