DocumentCode :
2712296
Title :
Simulation of warpage considering both thermal and cure induced shrinkage during molding in IC packaging
Author :
Hong, Li-Ching ; Hwang, Sheng-Jye ; Lee, Huei-Huang ; Durn-Yuan Huang
fYear :
2004
fDate :
12-15 Sept. 2004
Firstpage :
78
Lastpage :
84
Keywords :
Computational modeling; Costs; Electromagnetic compatibility; Electronic packaging thermal management; Equations; Integrated circuit packaging; Plastic packaging; Predictive models; Temperature; Thermal engineering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Polymers and Adhesives in Microelectronics and Photonics, 2004. POLYTRONIC 2004. 4th IEEE International Conference on
Print_ISBN :
0-7803-8744-9
Type :
conf
DOI :
10.1109/POLYTR.2004.1402743
Filename :
1402743
Link To Document :
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