Title :
Measurement accuracy of S-parameters in W band at cryogenic temperature
Author :
Zannoni, M. ; Baù, A. ; Gervasi, M. ; Passerini, A. ; Spinelli, S. ; Tartari, A. ; Sironi, G.
Author_Institution :
Univ. di Milano Bicocca, Milano, Italy
Abstract :
Room temperature VNA calibration to measure cryogenic devices can be inadequate when the loss of the unavoidable thermal decoupling line is order of magnitude higher than the DUT one. We present a cryogenic calibration setup with an accuracy at the level of some tens of milli-dB for S21 parameter.
Keywords :
S-parameters; calibration; cryogenics; S parameter; VNA calibration; cryogenic device; cryogenic temperature; thermal decoupling;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5612595
