Title :
A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients
Author :
Satapathy, Saroj ; Won Ho Choi ; Xiaofei Wang ; Kim, Chris H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
Abstract :
Bias Temperature Instability (BTI) under sub-microsecond DVFS transients manifests as instantaneous frequency degradation and recovery that has been predicted in past literature but has never been experimentally verified due to difficulty in obtaining high quality data. This work demonstrates a new odometer circuit specifically designed to measure the aforementioned effect. The basic idea is to use multiple fresh reference ring oscillators (ROSCs), which alternately take measurements to minimize any degradation in the reference ROSC´s frequency and thereby enhancing the sampling time as well as the sampling resolution. Measurements from a 65nm test chip show excellent were taken under different voltage supply, temperature, stress time duration, and supply ramp time.
Keywords :
distance measurement; frequency measurement; oscillators; sensors; BTI-induced frequency fluctuation measurement; ROSC; bias temperature instability; dynamic voltage and frequency scaling; fast submicrosecond DVFS transient; instantaneous frequency degradation; reference ring oscillator; revolving reference odometer circuit; size 65 nm; stress time duration; supply ramp time; test chip; voltage supply; Degradation; Semiconductor device measurement; Stress; Temperature measurement; Time-frequency analysis; Voltage measurement; BTI; fast DVFS; guard band; odometer; on-chip monitor; recovery; revolving reference; stress;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2015 IEEE International
Conference_Location :
Monterey, CA
DOI :
10.1109/IRPS.2015.7112757
