Title :
3D-FEM analysis for shielding effects of a metallic enclosure with apertures
Author :
Tanabe, Shinji ; Nagano, Nobuyuki ; Itoh, Takahiko ; Murata, Yuichiro ; Mizukawa, Shigemitsu
Author_Institution :
Mitsubishi Electr. Corp., Hyogo, Japan
Abstract :
The leakage of electromagnetic (EM) waves from a metallic enclosure with apertures, from a metallic mesh and from a metallic shield thinner than the skin depth are numerically analyzed using a three dimensional finite element method (3D-FEM). The calculated results were compared with measured results using a simple shape model enclosure with a generator inside. The phenomena predicted by the numerical analysis agree with the measurement results
Keywords :
electromagnetic interference; electromagnetic shielding; finite element analysis; 3D-FEM analysis; EM wave leakage; apertures; electromagnetic waves; metallic enclosure; metallic mesh; metallic shield; numerical analysis; shielding effects; skin depth; three dimensional finite element method; Aluminum; Apertures; Conductivity; Eddy currents; Frequency; Magnetic analysis; Magnetic shielding; Permittivity; Skin; Thin film transistors;
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
DOI :
10.1109/ISEMC.1996.561261
