DocumentCode :
2712993
Title :
50 years or more on RF and Microwave Measurements
Author :
Adam, Stephen F.
Author_Institution :
Adam Microwave Consulting Inc., Los Altos, CA
fYear :
2006
fDate :
11-16 June 2006
Firstpage :
993
Lastpage :
995
Abstract :
The bay area is known for its leadership in the development of microwave technology, and for the creation of instruments used throughout the microwave industry. This work often facilitated new areas of microwave development application and commercialization. This exciting period will be reviewed and placed in perspective
Keywords :
microwave measurement; RF measurements; microwave industry; microwave measurements; microwave technology; Calibration; Dynamic range; Instruments; Integrated circuit measurements; Metrology; Microwave measurements; Radio frequency; Signal analysis; Temperature sensors; Thermistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
ISSN :
0149-645X
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2006.249908
Filename :
4015083
Link To Document :
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