Title :
SAT-Based Automatic Rectification and Debugging of Combinational Circuits with LUT Insertions
Author :
Jo, Satoshi ; Matsumoto, Takeshi ; Fujita, Masahiro
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Tokyo, Tokyo, Japan
Abstract :
Introducing partial programmability in circuits by replacing some gates with look up tables (LUTs) can be an effective way to improve post-silicon or in-field rectification and debugging. Although finding configurations of LUTs that can correct the circuits can be formulated as a QBF problem, solving it by state-of-the-art QBF solvers is still a hard problem for large circuits and many LUTs. In this paper, we present a rectification and debugging method for combinational circuits with LUTs by repeatedly applying Boolean SAT solvers. Through the experimental results, we show our proposed method can quickly find LUT configurations for large circuits with many LUTs, which cannot be solved by a QBF solver.
Keywords :
combinational circuits; program debugging; table lookup; Boolean SAT solver; LUT insertion; QBF solver; SAT based automatic rectification; combinational circuit; debugging method; in-field rectification; look up tables; partial programmability; Circuit faults; Combinational circuits; Debugging; Field programmable gate arrays; Logic functions; Logic gates; Table lookup; debugging; look-up table; rectification; satisfiability;
Conference_Titel :
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location :
Niigata
Print_ISBN :
978-1-4673-4555-2
Electronic_ISBN :
1081-7735
DOI :
10.1109/ATS.2012.55