DocumentCode :
2713107
Title :
Increase of fundamental oscillation frequency in resonant tunneling diode with thin barrier and graded emitter structures
Author :
Suzuki, Safumi ; Teranishi, Atsushi ; Asada, Masahiro ; Sugiyama, Hiroki ; Yokoyama, Haruki
Author_Institution :
Interdiscipl. Grad. Sch. of Sci. & Technol., Tokyo Inst. of Technol., Tokyo, Japan
fYear :
2010
fDate :
5-10 Sept. 2010
Firstpage :
1
Lastpage :
2
Abstract :
We obtained increase in oscillation frequency of resonant tunneling diodes (RTDs) using graded emitter and thin barriers for reduced transit and tunneling times. The fundamental oscillation frequency of 1.04 THz was achieved with this structure. The dependence of output power on oscillation frequency is also shown. The output power was around 10 μW in 0.9-1 THz region.
Keywords :
oscillations; resonant tunnelling diodes; frequency 1.04 THz; fundamental oscillation frequency; graded emitter structures; resonant tunneling diode; thin barrier; Current density; Delay; Oscillators; Power generation; Resonant frequency; Time frequency analysis; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
Type :
conf
DOI :
10.1109/ICIMW.2010.5612616
Filename :
5612616
Link To Document :
بازگشت