Optical absorption and Photoluminescence in ultra thin silver and silver iodide films

Author

Gnanavel, M. ; Sunandana, C.S.

Author_Institution

Sch. of Phys., Univ. of Hyderabad, Hyderabad

fYear

2008

fDate

8-11 Dec. 2008

Firstpage

1

Lastpage

4

Abstract

Silver thin films in the thickness range 3-10 nm produced by thermal evaporation onto glass substrates were systematically iodized and carefully characterized by XRD, AFM and optical absorption and cw photoluminescence (PL) spectroscopy while the uniodized films are X-ray amorphous in view of their quasi-continuous nature and 2D islanded structure, briefly-iodized films showed characteristic beta AgI structure. Optical absorption spectra of uniodized Ag films show intense surface plasmon resonance (SPR) features with maxima at 440, 484 and 498 nm for the films of thickness 3, 5 and 10 nm. PL shows a thickness dependent emission suggesting the involvement of Frenkel defects in non-radiative recombination.

Keywords

Frenkel defects; X-ray diffraction; atomic force microscopy; island structure; optical films; optical glass; photoluminescence; silver compounds; surface plasmon resonance; vacuum deposited coatings; visible spectra; 2D islanded structure; AFM; AgI; Frenkel defect; X-ray amorphous; XRD; glass substrate; nonradiative recombination; optical absorption spectra; photoluminescence spectroscopy; quasicontinuous nature; silver iodide film; size 3 nm to 10 nm; surface plasmon resonance; thermal evaporation; ultra thin silver film; wavelength 440 nm; wavelength 484 nm; wavelength 498 nm; Amorphous materials; Electromagnetic wave absorption; Glass; Optical films; Photoluminescence; Plasmons; Silver; Spectroscopy; Stimulated emission; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

PhotonicsGlobal@Singapore, 2008. IPGC 2008. IEEE

Conference_Location

Singapore

Print_ISBN

978-1-4244-3901-0

Electronic_ISBN

978-1-4244-2906-6

Type

conf

DOI

10.1109/IPGC.2008.4781352

Filename

4781352