Title :
A new method of determining the effective channel width and its dependence on the gate voltage
Author :
Jeppson, Kjell O. ; Bogren, Anders W. ; Karlsson, Peter R.
Author_Institution :
Dept. of Solid State Electron., Chalmers Univ. of Technol., Goteborg, Sweden
Abstract :
A novel and simple method for the extraction of the effective channel width and its dependence on the gate voltage is presented. Both synthetic and measured data have been used to evaluate the new method which is superior to previous methods in not assuming any particular width or gate voltage dependencies of the series resistance
Keywords :
MOSFET; MOSFET; effective channel width; gate voltage; series resistance; Data mining; Electrical resistance measurement; Fluctuations; Geometry; Integrated circuit measurements; Particle measurements; Performance evaluation; Robustness; Solid state circuits; Voltage;
Conference_Titel :
Microelectronic Test Structures, 1996. ICMTS 1996. Proceedings. 1996 IEEE International Conference on
Conference_Location :
Trento
Print_ISBN :
0-7803-2783-7
DOI :
10.1109/ICMTS.1996.535637
