DocumentCode
2713345
Title
A new method of determining the effective channel width and its dependence on the gate voltage
Author
Jeppson, Kjell O. ; Bogren, Anders W. ; Karlsson, Peter R.
Author_Institution
Dept. of Solid State Electron., Chalmers Univ. of Technol., Goteborg, Sweden
fYear
1996
fDate
25-28 Mar 1996
Firstpage
151
Lastpage
156
Abstract
A novel and simple method for the extraction of the effective channel width and its dependence on the gate voltage is presented. Both synthetic and measured data have been used to evaluate the new method which is superior to previous methods in not assuming any particular width or gate voltage dependencies of the series resistance
Keywords
MOSFET; MOSFET; effective channel width; gate voltage; series resistance; Data mining; Electrical resistance measurement; Fluctuations; Geometry; Integrated circuit measurements; Particle measurements; Performance evaluation; Robustness; Solid state circuits; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 1996. ICMTS 1996. Proceedings. 1996 IEEE International Conference on
Conference_Location
Trento
Print_ISBN
0-7803-2783-7
Type
conf
DOI
10.1109/ICMTS.1996.535637
Filename
535637
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