DocumentCode :
2713345
Title :
A new method of determining the effective channel width and its dependence on the gate voltage
Author :
Jeppson, Kjell O. ; Bogren, Anders W. ; Karlsson, Peter R.
Author_Institution :
Dept. of Solid State Electron., Chalmers Univ. of Technol., Goteborg, Sweden
fYear :
1996
fDate :
25-28 Mar 1996
Firstpage :
151
Lastpage :
156
Abstract :
A novel and simple method for the extraction of the effective channel width and its dependence on the gate voltage is presented. Both synthetic and measured data have been used to evaluate the new method which is superior to previous methods in not assuming any particular width or gate voltage dependencies of the series resistance
Keywords :
MOSFET; MOSFET; effective channel width; gate voltage; series resistance; Data mining; Electrical resistance measurement; Fluctuations; Geometry; Integrated circuit measurements; Particle measurements; Performance evaluation; Robustness; Solid state circuits; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1996. ICMTS 1996. Proceedings. 1996 IEEE International Conference on
Conference_Location :
Trento
Print_ISBN :
0-7803-2783-7
Type :
conf
DOI :
10.1109/ICMTS.1996.535637
Filename :
535637
Link To Document :
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