DocumentCode
2713664
Title
A New Procedure for Measuring High-Accuracy Probability Density Functions
Author
Yamaguchi, Takahiro J. ; Asada, Kunihiro ; Niitsu, Kiichi ; Abbas, Mohamed ; Komatsu, Satoshi ; Kobayashi, Haruo ; Moreira, Jose A.
Author_Institution
Advantest Labs., Ltd., Sendai, Japan
fYear
2012
fDate
19-22 Nov. 2012
Firstpage
185
Lastpage
190
Abstract
This paper proposes a new procedure for calculating high-accuracy PDF estimates, which are free of random error and nearly free of bias error. The procedure is verified experimentally using random jitter and a 16-bit ADC.
Keywords
analogue-digital conversion; error statistics; jitter; probability; ADC; bias error; high-accuracy PDF estimates; high-accuracy probability density function; random error; random jitter; word length 16 bit; Histograms; Jitter; Kernel; Measurement uncertainty; Probability density function; Radiation detectors; Random variables;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location
Niigata
ISSN
1081-7735
Print_ISBN
978-1-4673-4555-2
Electronic_ISBN
1081-7735
Type
conf
DOI
10.1109/ATS.2012.25
Filename
6394197
Link To Document