Title :
Development of an embedded terminal protection device (TPD) tester
Author :
Hoeft, Lothar O. ; Salas, Thomas M. ; Prather, William D.
Author_Institution :
BDM Federal Inc., Albuquerque, NM, USA
Abstract :
A test technique has been developed that can measure the clamp voltage of embedded terminal protection devices and thus determine their functionality with the application of a single pulse. The use of a moderate (50 ns) risetime reduces the artifact associated with the circuit elements and parasitic reactances. Pulse durations of several hundred nanoseconds are adequate for measuring the clamp voltage of TPDs in a wide range of circuits. With the appropriate choice of pulse duration and amplitude, the technique can be used in automatic test systems
Keywords :
aircraft maintenance; aircraft testing; automatic test equipment; electromagnetic compatibility; electronic equipment testing; protection; voltage measurement; 50 ns; aircraft; automatic test systems; circuit elements; circuits; clamp voltage; electromagnetic hardness surveillance; embedded terminal protection device tester; line replaceable units; maintenance; moderate risetime; parasitic reactances; pulse durations; single pulse; Aircraft; Automatic testing; Circuit testing; Clamps; Electromagnetic measurements; Protection; Pulse circuits; Pulse measurements; Voltage measurement; Wiring;
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
DOI :
10.1109/ISEMC.1996.561265
