Title :
Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs
Author :
Cook, Alan ; Ull, Dominik ; Elm, M. ; Wunderlich, Hans-Joachim ; Randoll, H. ; Dohren, S.
Author_Institution :
Inst. of Comput. Archit. & Comput. Eng., Univ. of Stuttgart, Stuttgart, Germany
Abstract :
The automotive industry has to deal with an increasing amount of electronics in today´s vehicles. This paper describes the advantages of structural tests during in-field system test, reusing existing test data and on-chip structures. Demonstration is the embedded test of an ASIC within an automotive control unit, utilizing manufacturing scan-tests.
Keywords :
application specific integrated circuits; automotive electronics; integrated circuit testing; automotive ASIC; automotive control unit; automotive industry; electronics; in-field system test; manufacturing scan-test; structural volume test method; Automotive engineering; Built-in self-test; Clocks; Failure analysis; Manufacturing; System-on-a-chip; automotive; electronic control unit; in-field; scan-test; system test;
Conference_Titel :
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location :
Niigata
Print_ISBN :
978-1-4673-4555-2
Electronic_ISBN :
1081-7735
DOI :
10.1109/ATS.2012.32
