Title :
Determination of refractive index profile of the planar waveguide by wedge technique and chemical sample preparation
Author :
Hosseini, S. M R Sadat ; Darudi, A. ; Tavassoly, M.T. ; Granpayeh, N. ; Goodarzi, A.
Author_Institution :
Iran Telecom Res. Center, Tehran, Iran
Abstract :
In this paper we will present determination of refractive index profile of an ion exchanged planar waveguide using wedge technique and chemical sample preparation. Several planar waveguides have been fabricated. We applied a chemical method to creating a wedge from a planar waveguide. The RIP was determined by inserting the sample in a Mach-Zehnder interferometer and applying fringe analysis methods.
Keywords :
Mach-Zehnder interferometers; ion exchange; optical fabrication; optical planar waveguides; refractive index; refractive index measurement; Mach-Zehnder interferometer; chemical sample preparation; fringe analysis; ion exchange; planar waveguide; refractive index profile; wedge technique; Chemicals; Glass; Hafnium; Optical interferometry; Optical planar waveguides; Optical refraction; Optical variables control; Optical waveguides; Planar waveguides; Refractive index;
Conference_Titel :
Advanced Optoelectronics and Lasers, 2005. Proceedings of CAOL 2005. Second International Conference on
Print_ISBN :
0-7803-9130-6
DOI :
10.1109/CAOL.2005.1553967
