DocumentCode
2713964
Title
Analysis of advanced circuits for SET measurement
Author
Rui Liu ; Evans, Adrian ; Qiong Wu ; Yuanqing Li ; Li Chen ; Shi-Jie Wen ; Wong, Rick ; Fung, Rita
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Saskatchewan, Saskatoon, SK, Canada
fYear
2015
fDate
19-23 April 2015
Abstract
Single Event Transients (SETs) are a growing concern in advanced integrated circuits yet techniques to accurately characterize the cross-section and pulse width of SETs are less mature than those for measuring SEUs. We present four circuits for measuring SETs, an analysis of their capabilities and the subtleties in their implementation. Post-layout circuit simulation results are presented for a test-chip implemented in 28 nm FSDOI technology and integrating these detectors.
Keywords
integrated circuit testing; radiation hardening (electronics); silicon-on-insulator; FSDOI technology; SET cross-section; SET measurement; SET pulse width; SEU measurement; advanced circuit analysis; advanced integrated circuits; post-layout circuit simulation; single event transients; size 28 nm; Delays; Detectors; Flip-flops; Latches; Logic gates; Pulse measurements; Transient analysis; single event transient (SET);
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2015 IEEE International
Conference_Location
Monterey, CA
Type
conf
DOI
10.1109/IRPS.2015.7112827
Filename
7112827
Link To Document