Title :
Analysis of advanced circuits for SET measurement
Author :
Rui Liu ; Evans, Adrian ; Qiong Wu ; Yuanqing Li ; Li Chen ; Shi-Jie Wen ; Wong, Rick ; Fung, Rita
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Saskatchewan, Saskatoon, SK, Canada
Abstract :
Single Event Transients (SETs) are a growing concern in advanced integrated circuits yet techniques to accurately characterize the cross-section and pulse width of SETs are less mature than those for measuring SEUs. We present four circuits for measuring SETs, an analysis of their capabilities and the subtleties in their implementation. Post-layout circuit simulation results are presented for a test-chip implemented in 28 nm FSDOI technology and integrating these detectors.
Keywords :
integrated circuit testing; radiation hardening (electronics); silicon-on-insulator; FSDOI technology; SET cross-section; SET measurement; SET pulse width; SEU measurement; advanced circuit analysis; advanced integrated circuits; post-layout circuit simulation; single event transients; size 28 nm; Delays; Detectors; Flip-flops; Latches; Logic gates; Pulse measurements; Transient analysis; single event transient (SET);
Conference_Titel :
Reliability Physics Symposium (IRPS), 2015 IEEE International
Conference_Location :
Monterey, CA
DOI :
10.1109/IRPS.2015.7112827
