DocumentCode :
2714072
Title :
Modeling and simulation of flicker due to interharmonics
Author :
Virulkar, Vasudeo B. ; Aware, Mohan V.
Author_Institution :
Dept. of Electr. Eng., Govt. Coll. of Eng., Amravati, India
fYear :
2011
fDate :
28-30 Jan. 2011
Firstpage :
1
Lastpage :
5
Abstract :
Interharmonics are spectra components whose frequencies are not integral number of the supply fundamental frequency. When a voltage waveform contains interharmonics, the root mean square (rms) and peak magnitude of the waveform will fluctuate. This is because the periods of the interharmonic components are not synchronous with the fundamental frequency cycle. This fluctuating magnitude is essentially is a form of flicker. If the magnitude is sufficiently large and the fluctuation frequency is in a large perceptible by human eyes, a light flicker will occur. As a result, devices that produce interhamonics have been considered as a major source of light flicker. Variable frequency drives (VFDs) are widely used in various industry applications due to their efficiency and energy cost savings aspect. In spite of advanced technology and improved reliability of modern VFDs, they considered not only as harmonic sources but also interharmonic sources. The interharmonic-flicker curve based on rms and peak magnitude fluctuations and on the IEC flickermeter is presented.
Keywords :
mean square error methods; power supply quality; power system harmonics; reliability; variable speed drives; IEC flickermeter; fluctuation frequency; human eyes; interharmonic sources; interharmonic-flicker curve; interharmonics components; reliability; root mean square; variable frequency drives; voltage waveform; Educational institutions; Electrical engineering; Fluctuations; Harmonic analysis; Power system harmonics; Voltage fluctuations; Flicker curve; IEC flickermeter; interharmonics; variable frequency drives (VFD); voltage flicker;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics (IICPE), 2010 India International Conference on
Conference_Location :
New Delhi
Print_ISBN :
978-1-4244-7883-5
Type :
conf
DOI :
10.1109/IICPE.2011.5728100
Filename :
5728100
Link To Document :
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