Test structures for HF characterization of fully differential building blocks

Author

Peeters, E. ; Steyaert, M. ; Sansen, W.

Author_Institution

Dept. of Electr. Eng., Katholieke Univ., Leuven, Belgium

fYear

1996

fDate

25-28 Mar 1996

Firstpage

179

Lastpage

183

Abstract

A procedure is described which allows us to characterize fully differential building blocks as a linear 4-port. A new set of linear differential hybrid parameters is presented which are well suited to describe fully differential amplifiers. A measurement setup is described which allows us to determine the differential h-parameters from measured S-parameters obtained with a 2-port test set. Measurement results of a 400 MHz fully differential amplifier are presented which demonstrate the new measurement procedure

Keywords

S-parameters; UHF measurement; analogue integrated circuits; differential amplifiers; integrated circuit testing; operational amplifiers; 2-port test set; 400 MHz; HF characterization; S-parameters; differential amplifiers; differential h-parameters; fully differential building blocks; linear differential hybrid parameters; linear four-port; measurement setup; test structures; Circuits; Differential amplifiers; Differential equations; Hafnium; Impedance; Scattering parameters; Signal to noise ratio; Telephony; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 1996. ICMTS 1996. Proceedings. 1996 IEEE International Conference on

Conference_Location

Trento

Print_ISBN

0-7803-2783-7

Type

conf

DOI

10.1109/ICMTS.1996.535642

Filename

535642