Title :
The photothermal method for testing of parameters of thin-film coatings
Author :
Petrovska, Halyna ; Demkovych, Igor ; Bobitski, Yaroslav
Author_Institution :
Dept. of Photonics, Lviv Polytech Nat. Univ., Ukraine
Abstract :
In the given work the high speed photothermal method is offered. In this method a photothermal response in time after the irradiation of sample by one short impulse is registered. For method realization the heat distribution theory in sandwich-type systems is developed and software for the design of thermal response after laser impulse irradiation (with given parameters) on such systems is created.
Keywords :
antireflection coatings; laser beam effects; optical films; photothermal effects; thickness measurement; heat distribution theory; laser impulse irradiation; photothermal method; thin-film coatings; Coatings; Electrical equipment industry; Industrial control; Laser theory; Metals industry; Optical materials; Power lasers; Testing; Thickness measurement; Transistors;
Conference_Titel :
Advanced Optoelectronics and Lasers, 2005. Proceedings of CAOL 2005. Second International Conference on
Print_ISBN :
0-7803-9130-6
DOI :
10.1109/CAOL.2005.1553982
