DocumentCode
2714180
Title
The photothermal method for testing of parameters of thin-film coatings
Author
Petrovska, Halyna ; Demkovych, Igor ; Bobitski, Yaroslav
Author_Institution
Dept. of Photonics, Lviv Polytech Nat. Univ., Ukraine
Volume
2
fYear
2005
fDate
12-17 Sept. 2005
Firstpage
290
Abstract
In the given work the high speed photothermal method is offered. In this method a photothermal response in time after the irradiation of sample by one short impulse is registered. For method realization the heat distribution theory in sandwich-type systems is developed and software for the design of thermal response after laser impulse irradiation (with given parameters) on such systems is created.
Keywords
antireflection coatings; laser beam effects; optical films; photothermal effects; thickness measurement; heat distribution theory; laser impulse irradiation; photothermal method; thin-film coatings; Coatings; Electrical equipment industry; Industrial control; Laser theory; Metals industry; Optical materials; Power lasers; Testing; Thickness measurement; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Optoelectronics and Lasers, 2005. Proceedings of CAOL 2005. Second International Conference on
Print_ISBN
0-7803-9130-6
Type
conf
DOI
10.1109/CAOL.2005.1553982
Filename
1553982
Link To Document