DocumentCode
2714447
Title
Inverted SP resonance in palladium in Kretchmann configuration
Author
Kohns, P. ; Logacheva, E.I. ; Makin, V.S. ; Pestov, Yu.I.
Author_Institution
Diospec, Bonn, Germany
Volume
2
fYear
2005
fDate
12-17 Sept. 2005
Firstpage
340
Abstract
The surface plasmon resonance in Kretchmann configuration showing reflectivity maxima in thin palladium films has been discovered and investigated. The resonant curve form and angular position are influenced by thin film palladium properties of which (the frequency of nonelastic electron collisions in metal (γ) and the metal electron plasma frequency (ωρ)) depend on concentration of hydrogen in ambient medium. It is shown that by increasing the γ value and decreasing the cup value the resonant curve half-width broadens. Behavior of reflected beam phase as functions of γ and cup was simulated. It is shown that inverted resonance for surface plasmons for palladium may be used for a wide class of SP-based sensors, in particular, for sensors of small hydrogen concentration.
Keywords
metallic thin films; palladium; reflectivity; surface plasmon resonance; Kretchmann configuration; Pd; hydrogen concentration; inverted SP resonance; metal electron plasma frequency; nonelastic electron collisions; reflectivity; surface plasmon resonance; thin palladium films; Electrons; Frequency; Hydrogen; Optical films; Palladium; Plasma properties; Plasmons; Reflectivity; Resonance; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Optoelectronics and Lasers, 2005. Proceedings of CAOL 2005. Second International Conference on
Print_ISBN
0-7803-9130-6
Type
conf
DOI
10.1109/CAOL.2005.1553998
Filename
1553998
Link To Document