• DocumentCode
    2714447
  • Title

    Inverted SP resonance in palladium in Kretchmann configuration

  • Author

    Kohns, P. ; Logacheva, E.I. ; Makin, V.S. ; Pestov, Yu.I.

  • Author_Institution
    Diospec, Bonn, Germany
  • Volume
    2
  • fYear
    2005
  • fDate
    12-17 Sept. 2005
  • Firstpage
    340
  • Abstract
    The surface plasmon resonance in Kretchmann configuration showing reflectivity maxima in thin palladium films has been discovered and investigated. The resonant curve form and angular position are influenced by thin film palladium properties of which (the frequency of nonelastic electron collisions in metal (γ) and the metal electron plasma frequency (ωρ)) depend on concentration of hydrogen in ambient medium. It is shown that by increasing the γ value and decreasing the cup value the resonant curve half-width broadens. Behavior of reflected beam phase as functions of γ and cup was simulated. It is shown that inverted resonance for surface plasmons for palladium may be used for a wide class of SP-based sensors, in particular, for sensors of small hydrogen concentration.
  • Keywords
    metallic thin films; palladium; reflectivity; surface plasmon resonance; Kretchmann configuration; Pd; hydrogen concentration; inverted SP resonance; metal electron plasma frequency; nonelastic electron collisions; reflectivity; surface plasmon resonance; thin palladium films; Electrons; Frequency; Hydrogen; Optical films; Palladium; Plasma properties; Plasmons; Reflectivity; Resonance; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Optoelectronics and Lasers, 2005. Proceedings of CAOL 2005. Second International Conference on
  • Print_ISBN
    0-7803-9130-6
  • Type

    conf

  • DOI
    10.1109/CAOL.2005.1553998
  • Filename
    1553998