DocumentCode :
2714523
Title :
Modeling Large Screens via Homogenization with the Finite Element Method
Author :
Bardi, Istvan ; Vogel, Martin ; Cendes, Zoltan J.
Author_Institution :
Ansoft Corp., Pittsburgh, PA
fYear :
2006
fDate :
11-16 June 2006
Firstpage :
1315
Lastpage :
1318
Abstract :
The finite element method (FEM) is applied to calculate the screening effect of electromagnetic radiation through screens with periodic perforations. In this procedure, screens of large extent with complex but periodic geometry are replaced during the FEM simulation by sheets representing anisotropic impedance boundary conditions. The homogenized anisotropic impedance boundary conditions are calculated from a single unit cell of the screen by using the finite element method. The FEM is modified to handle the new anisotropic impedance boundary condition. Replacing large screens with an impedance boundary condition reduces the size of the finite element mesh and allows more complex structures to be simulated. While the procedure is approximate, it does provide good accuracy to determine levels of EMC/EMI radiation in complex electronic equipment. The method is applied to compute the radiation emanating from a real-life electronic printed circuit board enclosed in a real-life computer cabinet
Keywords :
electromagnetic compatibility; electromagnetic interference; electromagnetic shielding; finite element analysis; EMC radiation; EMI radiation; FEM simulation; anisotropic impedance boundary conditions; electromagnetic radiation; electronic printed circuit board; finite element method; periodic perforations; screening effect; single unit cell; Anisotropic magnetoresistance; Boundary conditions; Circuit simulation; Computational modeling; Electromagnetic compatibility; Electromagnetic radiation; Finite element methods; Geometry; Impedance; Solid modeling; EMC/EMI; Finite Element Method; anisotropic impedance boundary condition; homogenization; periodic structures; screening;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
ISSN :
0149-645X
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2006.249472
Filename :
4015165
Link To Document :
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