DocumentCode :
2714711
Title :
Efficiency Enhancement of 250W Doherty Power Amplifiers Using Virtual Open Stub Techniques for UHF-band OFDM Applications
Author :
Horiguchi, Kenichi ; Ishizaka, Satoru ; Okano, Toru ; Nakayama, Masatoshi ; Ryoji, Hayashi ; Isota, Youji ; Takagi, Tadashi
Author_Institution :
Inf. Technol. R&D Center, Mitsubishi Electr. Corp., Kanagawa
fYear :
2006
fDate :
11-16 June 2006
Firstpage :
1356
Lastpage :
1359
Abstract :
We propose a new efficiency enhancement method of Doherty power amplifiers (PAs) using virtual open stub techniques. In this method, we consider a peak amplifier´s output line as a virtual capacitive open stub only seen at low power level. Using this method, we can transform the low power load impedance seen from the carrier amplifier into higher than the impedance of classical Doherty PA (>100ohm). The relations of the load impedance and the length of the virtual open stub are derived analytically. The developed UHF-band 250W 2-way Doherty PA has been achieved a drain efficiency of 42.1% and an intermodulation (IM) distortion of -27.3dBc at an output power of 44.1dBm (10dB output backed-off) under an integrated services digital broadcasting-terrestrial (ISDB-T) OFDM signal. To the best of our knowledge, these results are the highest backed-off efficiency ever reported among the over 40dBm saturation high power Doherty amplifiers
Keywords :
OFDM modulation; UHF power amplifiers; digital audio broadcasting; 250 W; Doherty power amplifiers; OFDM signal; UHF-band OFDM aplications; carrier amplifier; integrated services digital broadcasting-terrestrial; intermodulation distortion; load impedance; virtual capacitive open stub; Communication standards; Data communication; Digital multimedia broadcasting; High power amplifiers; Impedance; Intermodulation distortion; Intserv networks; OFDM; Power amplifiers; Power generation; MOSFETs; OFDM; efficiency; microwave Doherty amplifiers; power amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
ISSN :
0149-645X
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2006.249501
Filename :
4015177
Link To Document :
بازگشت