Title :
Computational aspects of a nonlinear problem involving electromagnetic transients in ferromagnetic shields
Author :
Croisant, William J. ; Feickert, Carl A. ; McInerney, Michael K.
Author_Institution :
U.S. Army Construction Eng. Res. Labs., Champaign, IL, USA
Abstract :
Previously, an analytical procedure was developed to characterize the nonlinear electric field transients induced at the inner surface of long, thin-walled, cylindrical, electrically conductive, ferromagnetic shields by short-duration, surface current pulses directed axially along the outer surface. The analytical procedure uses mathematical analysis supplemented with numerical calculations. Previous papers emphasized the mathematical aspects of the problem. This paper considers the computational aspects. Some practical aspects associated with the implementation of a finite difference time-domain (FDTD) formulation are discussed. The effects of spatial and time increments on numerical results are investigated. A method for estimating the residual error in benchmark calculations is proposed and demonstrated, and results of example calculations are presented
Keywords :
conducting materials; electric current; electromagnetic induction; electromagnetic shielding; error analysis; ferromagnetic materials; finite difference time-domain analysis; transient analysis; FDTD; analytical procedure; computational aspects; electrically conductive shields; electromagnetic transients; ferromagnetic shields; finite difference time-domain; inner surface; mathematical analysis; nonlinear electric field transients; nonlinear problem; outer surface; residual error estimation; short-duration surface current pulses; spatial increments; thin-walled cylindrical ferromagnetic shields; time increments; EMP radiation effects; Electromagnetic fields; Finite difference methods; Magnetic analysis; Magnetic materials; Mathematical analysis; Permeability; Thin wall structures; Time domain analysis; Transient analysis;
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
DOI :
10.1109/ISEMC.1996.561272