DocumentCode
2714994
Title
An numerical technique for parameter extraction of VLSI interconnection
Author
Zhao, Yang ; Yun-yi Wang
Author_Institution
Dept. of Radio Eng., Southeast Univ., Nanjing, China
Volume
3
fYear
1997
fDate
2-5 Dec 1997
Firstpage
1053
Abstract
This letter proposes the substructure-front (S-F) technique in conjunction with geometry independent measured equation of invariance (GIMEI) for fast parameter extraction of multilayer and multiconductor interconnect based on finite element method (FEM) for VLSI circuit analysis. Results show that they are in good agreement with the published results and great computer resource can be saved via the efficient numerical scheme
Keywords
VLSI; finite element analysis; integrated circuit interconnections; integrated circuit modelling; VLSI interconnection; circuit analysis; finite element method; geometry independent measured equation of invariance; multiconductor interconnect; multilayer interconnect; numerical technique; parameter extraction; substructure-front technique; Conductors; Frequency; Geometry; Integral equations; Integrated circuit interconnections; Laboratories; Millimeter wave measurements; Millimeter wave technology; Parameter extraction; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference Proceedings, 1997. APMC '97, 1997 Asia-Pacific
Print_ISBN
962-442-117-X
Type
conf
DOI
10.1109/APMC.1997.656397
Filename
656397
Link To Document