• DocumentCode
    2715258
  • Title

    Analysis of discharge phenomena under non-uniform electric field in vacuum using image processing

  • Author

    Hayakawa, N. ; Fujimori, M. ; Hikita, M. ; Okubo, H.

  • Author_Institution
    Nagoya Univ., Japan
  • fYear
    1994
  • fDate
    5-8 Jun 1994
  • Firstpage
    241
  • Lastpage
    244
  • Abstract
    We measured dc discharge inception voltage Vi in air, N2 and He gases for various kinds of electrode configurations by changing vacuum range from 0.1 MPa to 0.1 Pa. By comparison with the uniform field characteristics, we investigated the discharge inception phenomena for non-uniform field in low and medium vacuum. At the same time, we observed the discharge type varying with gas pressure. Discussion was made on the discharge characteristics such as the polarity effect of Vi, and the comparison of Vi among the three kinds of gases with varying the field non-uniformity. In order to quantitatively discuss the changes of discharge type obtained above, we introduced the image processing method. We newly proposed four shape parameters to characterize the discharge type. Based on these analyses, the discharge type in air was successfully classified into three categories with two boundary pressures 200 and 2000 Pa over the pressure range from 1.3×104 to 27 Pa. We also analyzed discharge type in He gas in the same way as above
  • Keywords
    discharges (electric); electrodes; helium; image recognition; nitrogen; voltage measurement; 0.1 Pa to 0.1 MPa; DC discharge inception voltage; He; N2; boundary pressures; discharge phenomena; discharge type; electrode configurations; gas pressure; image processing; nonuniform electric field; polarity effect; shape parameters; Electric fields; Electrodes; Gases; Helium; Image analysis; Image processing; Nonuniform electric fields; Plasma temperature; Space technology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1994., Conference Record of the 1994 IEEE International Symposium on
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-1942-7
  • Type

    conf

  • DOI
    10.1109/ELINSL.1994.401521
  • Filename
    401521