Title :
Image restoration in the near-field optic and UHF microscopy
Author :
Dryakhlushin, V.F. ; Nozdrin, Yu.N. ; Reznik, A.N. ; Vaks, V.L. ; Zhilin, A.V.
Abstract :
Significant enhancement of resolution in the scanning near-field optical microscopy (SNOM) and in the microwave subsurface imaging (MSI) is achieved by deconvolution of measured 2-D images using Tikhonov´s method. This method makes it possible to obtain much better sharpness of images.
Keywords :
deconvolution; image resolution; image restoration; microwave imaging; near-field scanning optical microscopy; 2D image deconvolution; Tikhonov method; UHF microscopy; image resolution; image restoration; microwave subsurface imaging; scanning near-field optical microscopy; Computed tomography; Hidden Markov models; IEEE catalog; Image restoration; Optical microscopy; Organizing; Transfer functions;
Conference_Titel :
Microwave and Telecommunication Technology, 2002. CriMiCo 2002. 12th International Conference
Print_ISBN :
966-7968-12-X
DOI :
10.1109/CRMICO.2002.1137314
