Title :
Poster Presentation 5 : Image Quality Assessment Error Visibility Using Gradual Modulation Statistics
Author :
Sukumar, Vinesh ; Warner, Doug ; Doherty, Patrick ; Hess, Herbert ; Noren, Ken ; Krone, Steve
Author_Institution :
Micron Technology, Inc.
Abstract :
Measurement of visual quality if of fundamental importance to design algorithms that can automatically assess the quality of images or videos in a perceptually consistent manner. In this paper we do an extensive subjective study using varying modulation thresholds in an attempt to capture physiological and psychovisual features of a human visual system (HVS).
Keywords :
Additive noise; CMOS image sensors; Error analysis; Frequency; Humans; Image analysis; Image quality; Pixel; Psychology; Testing; CMOS Image Sensor; Defect Modeling and Noise;
Conference_Titel :
Microelectronics and Electron Devices, 2007. WMED 2007. IEEE Workshop on
Conference_Location :
Boise, ID, USA
Print_ISBN :
1-4244-1114-9
Electronic_ISBN :
1-4244-1114-9
DOI :
10.1109/WMED.2007.368066