Title :
The ATDP suite structure for adaptive testing of electronic system states
Author :
Magda, I.I. ; Pashchenko, A.V. ; Novikov, V.E.
Author_Institution :
Nat. Sci. Centre, Kharkov Inst. of Phys. & Technol., Ukraine
Abstract :
The structure and features of the adaptive testing and data processing software suite (ATDP suite) are presented. It is applied for the dynamic characteristics restoration, from experimental time series, of nonlinear and unstable electronic systems. The basic methods realized in the ATDP suite are demonstrated.
Keywords :
adaptive systems; circuit stability; computerised instrumentation; electromagnetic compatibility; electromagnetic interference; electronic engineering computing; electronic equipment testing; nonlinear network analysis; perturbation techniques; time series; ATDP suite; EMC testing; EMI; adaptive testing/data processing software suite; circuit chaotic behaviour; dynamic characteristics restoration; electromagnetic USP coupling; electromagnetic ultra-short-pulsed tests; electronic system state adaptive testing; nonlinear/unstable electronic system experimental time series; perturbations; Chaos; Circuit testing; Electromagnetic coupling; Electromagnetic devices; Electromagnetic radiation; Electronic equipment testing; Hidden Markov models; Nonlinear dynamical systems; Software testing; System testing;
Conference_Titel :
Microwave and Telecommunication Technology, 2002. CriMiCo 2002. 12th International Conference
Print_ISBN :
966-7968-12-X
DOI :
10.1109/CRMICO.2002.1137329
