DocumentCode
2716000
Title
Dielectric characterization by means of whispering gallery mode resonators
Author
Fittipaldi, M. ; Strambini, E. ; Martinelli, M. ; Annino, G.
Author_Institution
Dipt. di Chimica, Univ. di Firenze, Sesto Fiorentino, Italy
fYear
2010
fDate
5-10 Sept. 2010
Firstpage
1
Lastpage
2
Abstract
A methodology to characterize the complex dielectric permittivity of low-loss materials at millimeter and submillimeter wavelengths, based on whispering gallery mode dielectric resonators, is presented, together with some illustrative results.
Keywords
dielectric resonators; permittivity; whispering gallery modes; dielectric characterization; dielectric permittivity; low-loss material; submillimeter wavelength; whispering gallery mode resonator; Dielectrics; Frequency measurement; Materials; Optical resonators; Permittivity; Q factor; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location
Rome
Print_ISBN
978-1-4244-6655-9
Type
conf
DOI
10.1109/ICIMW.2010.5612784
Filename
5612784
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