Title :
Measurements and Analysis of Microwave Nonlinearities in Ferroelectric Thin Film Transmission Lines
Author :
Mateu, J. ; Booth, J.C. ; Schima, S.A. ; Collado, C. ; Seron, D. ; O´Callaghan, J.M.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO
Abstract :
This work evaluates the microwave nonlinear properties of ferroelectric BaSrTiO thin films by measuring the frequency response of several coplanar transmission lines and interdigital capacitor structures as a function of the applied electric field from 150 Hz to 40 GHz. From these measurements, we obtain the distributed nonlinear capacitance C(Vdc) as a function of dc bias. We also measure the harmonic generation at microwave frequencies in ferroelectric transmission lines, and use an accurate circuit model to obtain C(Vrf), the nonlinear capacitance as a function of RF bias. Information about the tuning speed of the film is obtained from a comparison between the two nonlinear capacitances. Characterization of this mechanism is also required to assess the spurious signal generation in ferroelectric-based devices
Keywords :
barium compounds; coplanar transmission lines; ferroelectric materials; ferroelectric thin films; frequency response; harmonic generation; microwave measurement; strontium compounds; titanium compounds; 150 Hz to 40 GHz; BaSrTiO; RF bias; circuit modeling; coplanar transmission lines; distributed nonlinear capacitance; ferroelectric thin film; ferroelectric transmission lines; ferroelectric-based devices; frequency response measurement; harmonic generation; interdigital capacitor structures; microwave measurements; microwave nonlinearities; spurious signal generation; Capacitance measurement; Capacitors; Coplanar transmission lines; Electric variables measurement; Ferroelectric materials; Frequency measurement; Frequency response; Microwave measurements; Transistors; Transmission line measurements; Ferroelectric films; Harmonic Balance; circuit modeling; microwave measurements; nonlinearities;
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2006.249648