Title : 
A low-noise parasitic-insensitive switched-capacitor CMOS interface circuit for MEMS capacitive sensors
         
        
            Author : 
Shiah, Jack ; Rashtian, Hooman ; Mirabbasi, Shahriar
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
         
        
        
        
        
        
            Abstract : 
This paper describes a differential low-noise high-resolution parasitic-insensitive switched-capacitor readout circuit that is intended for capacitive sensors, in particular, for MEMS inertial sensory systems. The operation of the proposed readout front-end circuit is explained. Amplitude modulation/demodulation and correlated double sampling techniques are used in the interface circuit to minimize the undesirable effects of the amplifier offset and flicker (1/f) noise. The application of the aforementioned techniques also further improve the sensitivity of the readout circuit. The interface system is designed and laid out in a 0.8 μm CMOS process. Post-layout simulation results demonstrate that the circuit is capable of resolving input sense capacitance variations as low as 0.5 aF with a sensitivity of 9.98 mV/aF. The circuit consumes 8.38 mW from a single 5 V supply.
         
        
            Keywords : 
1/f noise; CMOS integrated circuits; capacitive sensors; integrated circuit noise; microsensors; readout electronics; MEMS capacitive sensors; MEMS inertial sensory systems; amplifier offset effects; correlated double sampling techniques; flicker 1/f noise; interface circuit; low-noise CMOS interface circuit; modulation-demodulation amplitude; parasitic-insensitive CMOS interface circuit; post-layout simulation; readout front-end circuit; size 0.8 mum; switched-capacitor CMOS interface circuit; voltage 5 V; Capacitance; Capacitive sensors; Capacitors; Clocks; Micromechanical devices; Noise;
         
        
        
        
            Conference_Titel : 
New Circuits and Systems Conference (NEWCAS), 2011 IEEE 9th International
         
        
            Conference_Location : 
Bordeaux
         
        
            Print_ISBN : 
978-1-61284-135-9
         
        
        
            DOI : 
10.1109/NEWCAS.2011.5981272