Title :
A contextual maximum likelihood framework for modeling image registration
Author :
Wachinger, Christian ; Navab, Nassir
Author_Institution :
Comput. Aided Med. Procedures, Tech. Univ. Munchen, Garching, Germany
Abstract :
We introduce a novel probabilistic framework for image registration. This framework considers, in contrast to previous ones, local neighborhood information. We integrate the neighborhood information into the framework by adding layers of latent random variables, characterizing the descriptive information of each image. This extension has multiple advantages. It allows for a unified description of geometric and iconic registration, with the consequential analysis of similarities. It enables to arrange registration techniques in a continuum, limited by pure intensity-and feature-based registration. With this wide spectrum of techniques combined, we can model hybrid registration approaches. The probabilistic coupling allows further to deduce optimal descriptors and to model the adaptation of description layers during the process, as it is done for joint registration/segmentation. Finally, we deduce a new registration algorithm that allows for a dynamic adaptation of the description layers during the registration. Excellent results confirm the advantages of the new registration method, the major contribution of this article lies, however, in the theoretical analysis.
Keywords :
feature extraction; geometry; image registration; image segmentation; maximum likelihood estimation; probability; contextual maximum likelihood framework; description layer adaptation; geometric registration; hybrid registration approach; iconic registration; image descriptive information characterization; image registration modelling; intensity-and feature-based registration; joint registration-segmentation; local neighborhood information; optimal descriptors; probabilistic coupling; probabilistic framework; random variables; similarity consequential analysis; Context; Equations; Estimation; Graphical models; Mathematical model; Probabilistic logic; Random variables;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
Conference_Location :
Providence, RI
Print_ISBN :
978-1-4673-1226-4
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2012.6247902