Title :
Dual-Band Permittivity Measurement of Thin Dielectric Layers with a Simple Planar Device
Author :
Ocera, A. ; Dionigi, M. ; Fratticcioli, E. ; Sorrentino, R.
Author_Institution :
DIEI, Perugia Univ.
Abstract :
An improvement of a method for permittivity measurement is introduced based on a dual-band four port planar structure, consisting of two cascaded cross-coupled quadrature hybrids connected through two transmission lines. The applicability of the method to permittivity measurement of thin dielectrics is then demonstrated: permittivity are evaluated at two different frequencies f0 and n*f 0 (n=1,2,3..) by simply detecting the two output amplitudes, thus avoiding any phase measurement and allowing a remarkable space reduction. A prototype has been fabricated in microstrip technology and experimentally tested exhibiting very good accuracy for permittivity measurement at two different frequencies spaced by an octave band
Keywords :
coupled transmission lines; dielectric materials; dielectric thin films; microstrip directional couplers; permittivity measurement; cascaded quadrature hybrids; cross-coupled quadrature hybrids; dual band dielectric measurements; dual-band permittivity measurement; dual-band planar structure; four port planar structure; microstrip technology; simple planar device; thin dielectric layers; transmission lines; Dielectric devices; Dual band; Extraterrestrial measurements; Permittivity measurement; Phase detection; Phase frequency detector; Phase measurement; Planar transmission lines; Prototypes; Space technology; Permittivity measurements; dual band dielectric measurements; thin dielectrics;
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2006.249649
